Process Detector (For DVFS and monitoring process variation)
Defining the TLM-to-RTL Design Flow
(01/15/2007 12:30 PM EST) -- EE Times
As System-on-Chip (SoC) designs grow ever larger, design and verification flows are changing. A rich mix of features, increased software content, high intellectual property (IP) use and submicron implementation technology have semiconductor and system companies searching for new electronic system level (ESL)-based design flows.
An emerging trend is a transaction level modeling (TLM)-to-register transfer level (RTL) design flow, though a set of requirements needs to be addressed to ensure a successful transition to this new flow.
This article uses the generic term TLM to refer to a higher abstraction level model. Where necessary, it will be prefixed with cycle-accurate, cycle-approximate or functionally accurate to denote the accuracy level.
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