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Process Detector (For DVFS and monitoring process variation)
Addressing signal electromigration (EM) in today’s complex digital designs
Geetha Rangarajan – Synopsys, James Deng – Altera
EETimes (1/28/2013 10:53 AM EST)
Electromigration (EM) is a phenomenon that has been well researched and understood by the design community. At mature nodes, its impact on digital integrated circuits, particularly signal interconnects, has been minimal, making signal EM analysis and fixing an optional design step. At 28 nm and beyond, this is no longer the case. Interconnects are getting thinner, running longer and switching at gigahertz speeds - all of which amplify the effects of EM. Signal EM analysis and fixing is turning into a design requirement that must be met during place and route.
This article discusses the importance of signal EM and ways to address it in today’s complex designs. It also highlights the EM capabilities in IC Compiler with results from Altera’s successful adoption of the solution for its 28-nm high performance IPs.
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