D&R Industry Articles (April 2020)

Featured Article

Methodology to reduce Run Time of Timing/Functional Eco

In this paper, we are suggesting a methodology wherein eco can be implemented without re-running the Dummy metal fill again on the complete block/chip. This will save ECO implementation time and reduce the risk of any new signal integrity issues.

Featured Article

Embedded Software Unit Testing with Ceedling

Unit testing is a technique of breaking the code in small units of the entire code. These units can be verified to check the behaviour of a specific aspect of the software. One of the major challenges involved in unit testing of embedded software is that the code interacts with the hardware peripherals. In mostcases, hardware cannot be accessed during unit tests. Keeping hardware interaction as thin as possible helps in testing most of the code by dividing it into small pieces. These pieces can then be independently tested without hardware interaction.

Featured Article

SRAM PUF: A Closer Look at the Most Reliable and Most Secure PUF

A recent article on the reliability of SRAM PUFs as a security mechanism for connected devices raised points worthy of discussion. Certainly, in today’s ever-more-connected world of the internet of things (IoT) and proliferating 5G networks, hardware-based security is more important than ever. So, if you’re looking for a way to secure a connected device, how do you evaluate the security and reliability of the various options available?