1.8V/3.3V I2C 5V Failsafe Failtolerant Automotive Grade 1 in GF (12nm)
Industry Expert Blogs
Redefining Verification Performance (Part 2)Verification Horizons - Harry FosterAug. 10, 2010 |
In my last blog, I gave a few examples of different ways of thinking about getting more work done by finding solutions that increase amount of work accomplished per cycle, instead of just a brute-force approach to the problem. Before I talk about advanced verification solutions, I want to talk about why performance even matters.
First, we all intuitively know that the sooner we find a bug, the cheaper it is to fix. Doug Josephson and Bob Gottlieb attempt to quantify this notion in their chapter “Silicon Debug,” from the book Advances in Electronic Testing: Challenges and Methodologies (Springer, 2006). Figure 1 summarizes their findings in terms of the relative cost of finding bugs within a typical design cycle. Notice that a functional bug that prevents us from achieving first silicon success can cost us 10,000 X or more to fix than if it was found during the initial design phase.
Related Blogs
- Mitigating Side-Channel Attacks In Post Quantum Cryptography (PQC) With Secure-IC Solutions
- Moortec "Let's Talk PVT Monitoring" Series with CTO Oliver King
- Intel Embraces the RISC-V Ecosystem: Implications as the Other Shoe Drops
- Let's Talk PVT Monitoring: Thermal Issues Associated with Modern SoCs - How Hot is Hot?
- Experts Talk: RISC-V CEO Calista Redmond and Maven Silicon CEO Sivakumar P R on RISC-V Open Era of Computing