Industry Expert Blogs

Not a topic I usually write about but having a beer with Dr. Yervant Zorian during our recent Synopsys Users’ Group, got me thinking about the challenge of testing embedded IP, that is IP like a USB or DDR that is embedded in one of our customer’s chips. The challenge becomes compounded when multiple IP’s are integrated with different test access strategies, different test interfaces and different mechanisms to describe test patterns. The good news is that Yervant and his team have been looking at this problem  and here is a summary from Gevorg Torjyan.

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