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Industry Expert Blogs
7nm TCAM Silicon Testing Exceeds ExpectationseSilicon Blog - Kar Yee Tang & Dennis Dudeck, eSiliconOct. 11, 2018 |
eSilicon’s mission is to enable our partners with high-quality, reliable, silicon-proven IP. Our first 7nm ternary CAM (TCAM) test chip taped out in August 2017 and our silicon testing was completed mid-2018.
The TCAM compiler is a vital component in our 7nm FinFET IP Platform for our ASIC customers. The test chip was brought up smoothly (no smoke detectors were triggered) and the silicon results align with the characterization data. A full suite of ATE tests were developed and performed for multiple TCAM configurations and on-chip cycle time, access, setup, hold time, and power measurements correlated. The TCAM is fully functional when operated within 0.8x – 1.3x Vnom. Full memory SCAN and retention test covering down to 0.55V passed.