Embedded capability allows testing of unlimited SerDes channels at any frequency SAN JOSE, Calif. — April 11, 2005 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of yield learning solutions, today announced its breakthrough Embedded SerDes Test (EST) product. Available in June 2005 as part of the company’s LV2005 product release, this innovative industry leading IP-based technology will offer customers a unique embedded capability for testing an unlimited number of high-speed SerDes channels operating at any frequency. EST provides test accuracy equal to or higher than that available on the highest performance and highest cost external equipment. However, EST can be used with any high or low cost tester. This capability, combined with millisecond test times, results in dramatic test cost savings. EST is the only proven high performance embedded test solution introduced in the market.
High speed serial I/O technologies, typically known as SerDes I/O, are being rapidly adopted in data storage, telecommunications and personal computer applications. This is because they offer a reliable, low power and high data bandwidth capability using low-cost backplane and connector technologies. Significant test challenges are emerging as multiple SerDes channels with data rates of between 1 Gbps and beyond 10 Gbps are being integrated into SoC’s and FPGA’s. IC manufacturers are finding it increasingly expensive and time-consuming to guarantee all of the critical signal integrity parameters of these high speed I/O devices, especially while ramping-up yield.
LogicVision’s EST product provides a comprehensive structural test solution for measuring the key parameters required to ensure the performance and quality of these high speed I/O circuits. The new technology includes a suite of very high precision signal integrity tests including jitter, jitter tolerance, duty cycle and rise/fall times. All of these tests have sub-picosecond accuracy, run in milliseconds, and can be run using any external test equipment. An advanced release of EST is already in the field with industry recognized companies, and has been successfully verified with SerDes channels running over 10 Gbps.
“As I/O speeds increase, understanding high speed signal integrity has become critical to our customers. Providing high quality at low cost will enable SerDes to become a pervasive interconnect methodology,” said Jim Healy, president and CEO of LogicVision. “We believe LogicVision’s Embedded SerDes Test technology provides a compelling value proposition for our customers, with a combination of superior test performance, high speed parallel multi-port test, and very low-cost.”
About LogicVision Inc.
LogicVision provides yield learning software in the design for manufacturing (DFM) sector. The company's ETCreate (icBIST) allows designers to embed test capability directly in a semiconductor device. These embedded testers operate as “eyes in the die,” observing and testing the device, then use ETAccess to interface with external testers to identify failure mechanisms. LogicVision’s analysis software, SiVision, automates parametric verification of semiconductor ICs across the range of manufacturing and operating conditions. The benefits are rapid identification and resolution of design, product and manufacturing issues, allowing semiconductor companies to achieve the steepest yield learning ramp possible. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.
FORWARD LOOKING STATEMENTS:
Except for the historical information contained herein, the matters set forth in this press release, including statements as to the features and expected benefits of the Embedded SerDes Test product, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risks and uncertainties that could cause actual results to differ materially, including, but not limited to, the impact of competitive products and technological advances, and other risks detailed in Form 10-K for the year ended December 31, 2004, and from time to time in LogicVision's SEC reports. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.
LogicVision, Embedded Test, LogicVision Ready and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries. All other trademarks and service marks are the property of their respective owners.
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