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Rapport Adopts LogicVision Embedded Test Solutions for Next Generation Low-Power Device
SAN JOSE, Calif. — December 4, 2006 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of semiconductor test and yield learning solutions, today announced that Rapport, Inc., the technology leader in low-cost, dynamically configurable, massively parallel chips for compute-intensive applications at low power, has adopted LogicVision’s leading edge memory BIST solutions for next-generation Kilocore™ Architecture-based products.
The Rapport Kilocore devices address the shortcomings of conventional chips by putting hundreds or thousands of high performance parallel processing elements in small, low power consumption chips. These chips feature the most advanced, dynamic architecture available today in working silicon and can be dynamically reconfigured in real-time for consumer electronics, mobile gaming, homeland security, server components, image processing, and suitcase supercomputing. LogicVision’s Embedded Memory Test provides a unique built-in memory test solution for this type of device.
“LogicVision’s Memory BIST solution gives us the flexibility we need to effectively and efficiently test the different embedded memories in next-generation Rapport Kilocore Architecture devices,” said Dr. Benjamin Levine, Director of Chip Development at Rapport, Inc.“ LogicVision offers a solution that allows us to hierarchically group and test different types and sizes of memories and allows us to select the best options for testing each one. LogicVision also provides us with the tools to easily integrate their BIST solutions into our design flow with a minimum of effort.”
“As SoC design teams incorporate more embedded memories scattered throughout their device, they demand more automation and flexibility from their memory BIST solutions,” said Farhad Hayat, vice president of marketing at LogicVision. "As a leader in Memory BIST solutions, we provide a streamlined flow for implementing an optimum test strategy, when dealing with hundreds of memories within a single device, which helps customers such as Rapport meet their stringent manufacturing test requirements.”
Rapport, Inc., is the technology leader in developing next-generation, low-cost massively parallel chips with its Kilocore™ Architecture Computing Fabric. These chips can be dynamically configured for compute-intensive applications at low power, thereby addressing high-growth, feature-rich markets. The company is based in Redwood City, California. For more information, visit: http://www.kilocore.com.
About LogicVision, Inc.
LogicVision, Inc. provides unique test and yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company’s advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess and Yield Insight yield learning applications to improve profit margins by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif. For more information visit www.logicvision.com.
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