LogicVision Announces Industry's Most Comprehensive On-Chip eDRAM Test and Repair Solution
As silicon process technologies for eDRAMs have become more economical, the application of eDRAMs in SoCs, especially in consumer type applications, is growing rapidly. While embedding large blocks of DRAM into SoCs provides many cost and performance advantages, it also creates new test and yield challenges due to the higher circuit densities of eDRAMs over more traditional embedded SRAMS. This trend in turn is driving the need for advanced on-chip test and repair capabilities to enable cost-effective approaches for meeting quality and yield requirements.
Comprehensive support for eDRAM test and repair
ETMemory represents the industry's only comprehensive eDRAM test and repair solution. It uniquely provides the following key capabilities:
- DRAM operation support - supports all eDRAM communication requirements such as address interleaving, address multiplexing and auto refresh.
- Programmable test algorithms - support for both hard and soft programmability allowing user defined algorithms to be either integrated into embedded test controllers at design time or downloaded into embedded test controllers at test time. Hard programmability achieves high quality levels with low area overhead, while soft programmability provides the ability to handle unforeseen defect mechanisms during production, enabling quality without costly re-spins.
- Built-In Self Repair (BISR) - on-chip capabilities necessary to test, analyze and permanently repair eDRAMs containing redundancy including support for architectures using both spare rows and spare columns. The solution includes on-chip global fuse management, removing the need for external fuse data storage and greatly simplifying the manufacturing test flow.
- Automated RTL-level integration and verification flow for all on-chip test and repair resources integrated with all leading physical implementation flows.
- Compatible with LogicVision's comprehensive suite of silicon diagnostic solutions including Silicon Insight(TM) and ETAccess(TM)
Availability
ETMemory with full support for eDRAMs is in full production and available immediately.
About LogicVision Inc.
LogicVision (Nasdaq: LGVN - News) provides proprietary technologies for embedded test and yield learning that enable more efficient manufacturing test of complex semiconductors. LogicVision's embedded test solutions allow integrated circuit designers to embed test functionality into a semiconductor design that is used during semiconductor production test and throughout the useful life of the chip. The company's advanced Design for Test (DFT) product line, ETCreate(TM), works together with Silicon Insight(TM) applications and Yield Insight(TM) to improve profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time to market and time to yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com
|
Related News
- Synopsys Introduces Industry's First On-Chip Memory Test and Repair Solution for Embedded Flash
- LeCroy Announces Industry's Most Comprehensive MIPI Test Solutions
- LogicVision and Dolphin Technology Announce Integration of 90nm and 65nm memories with Comprehensive Self-test and Repair Solutions
- Logicvision plans on-chip test for mixed-signal SoCs
- Embedded SRAM test and repair moves on-chip
Breaking News
- Logic Design Solutions launches Gen4 NVMe host IP
- ULYSS1, Microcontroller (MCU) for Automotive market, designed by Cortus is available
- M31 is partnering with Taiwan Cooperative Bank to launch an Employee Stock Ownership Trust to strengthen talent retention
- Sondrel announces CEO transition to lead next phase of growth
- JEDEC Publishes LPDDR5 CAMM2 Connector Performance Standard
Most Popular
- Arm's power play will backfire
- Alphawave Semi Selected for AI Innovation Research Grant from UK Government's Advanced Research + Invention Agency
- Secure-IC obtains the first worldwide CAVP Certification of Post-Quantum Cryptography algorithms, tested by SERMA Safety & Security
- Weebit Nano continuing to make progress with potential customers and qualifying its technology Moving closer to finalisation of licensing agreements Q1 FY25 Quarterly Activities Report
- PUFsecurity Collaborate with Arm on PSA Certified RoT Component Level 3 Certification for its Crypto Coprocessor to Provide Robust Security Subsystem Essential for the AIoT era
E-mail This Article | Printer-Friendly Page |