LogicVision's Memory BIST & Automated Diagnosis Solutions Included by TSMC in Its Advanced Embedded Memory Development Program and QA Flow

SAN JOSE, Calif. -- July 1, 2009 -- LogicVision, Inc. (Nasdaq: LGVN), a leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced that Taiwan Semiconductor Mfg. Co. Ltd. (NYSE: TSM), a leading semiconductor foundry, has included its ETMemory(TM) memory Built-In Self-Test (BIST) and Silicon Insight(R) memory diagnostic solutions in TSMC's Memory development and QA procedures. ETMemory is a key component of LogicVision's Dragonfly Test Platform(TM) and provides TSMC with an advanced memory BIST IP and insertion automation solution. Silicon Insight, another Dragonfly test platform component, enables automated and interactive diagnosis and characterization of memories tested with ETMemory BIST.

"Embedded memories represent a key building block in today's SOCs. TSMC is committed to providing its customers with the most advanced embedded memory IP components as they migrate to 40nm and beyond," said Dan Kochpatcharin, deputy director, IP marketing at TSMC. "LogicVision provides an integrated solution that TSMC can efficiently insert BIST into our test chips without effecting design schedules while at the same time providing very powerful diagnostic capabilities crucial to understanding the performance metrics of TSMC memories."

LogicVision's ETMemory solution provides a comprehensive, integrated and low area overhead solution for at-speed test and repair of embedded memories. The solution provides automation for integrating and verifying embedded memory test and repair capabilities within any design. Once integrated, these capabilities not only provide a manufacturing test solution, but also deliver yield improvement through on-chip memory repair analysis and electrical Fuse management. LogicVision's Silicon Insight software provides a fully interactive graphical environment for diagnosing and characterizing memories tested using LogicVision's memory BIST capabilities. Memory failure information is generated in real time and can be analyzed with respect to parameters such as voltage and clock frequency. These solutions have been proven on hundreds of designs and across multiple technology nodes down to 40nm.

"Our ETMemory and Silicon Insight products have been developed to handle the industry's most advanced designs," said Stephen Pateras, Vice-President of Marketing at LogicVision. "We are proud that our solutions are playing an important role in TSMC's advanced memory development."

About LogicVision Inc.

LogicVision (Nasdaq: LGVN) provides a comprehensive set of proprietary built-in-self-test (BIST) technologies for achieving the highest quality silicon manufacturing test while reducing test costs for complex System-on-Chip devices. LogicVision's Dragonfly Test Platform(TM) enables integrated circuit designers to embed BIST functionality into a semiconductor design. This functionality is used during semiconductor production test and throughout the useful life of the chip. The complete Dragonfly Test Platform, including the ETCreate(TM), Silicon Insight(TM) and Yield Insight(TM) product families, improves profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time-to-market and time-to-yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.