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Rad-Hard Adjustable Sample Rate ADC, 12-bit, Ultra-Low Power
This innovative analog-to-digital data converter (ADC) combines high resolution, high sampling speed, and low power, and it is designed for high levels of radiation hardness. The ADC is hard to total ionizing dose (TID) of up to 3.5 Mrad(Si), and is immune to single-event latchup (SEL) and single-event functional interrupt (SEFI). Latency is below 100 ns, and power dissipation is 22.5 mW.
Ridgetop achieved high radiation hardness and performance levels using the IBM 8HP SiGe process.
The die is 4.6 x 4.6 mm, in a 48-pin QFN package. The pin-programmable sleep mode reduces power to 9 mW when idle.
Ridgetop achieved high radiation hardness and performance levels using the IBM 8HP SiGe process.
The die is 4.6 x 4.6 mm, in a 48-pin QFN package. The pin-programmable sleep mode reduces power to 9 mW when idle.
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Block Diagram of the Rad-Hard Adjustable Sample Rate ADC, 12-bit, Ultra-Low Power
