Zero-Error Systems (ZES) provides proprietary high-reliability semiconductor integrated circuits (ICs), library cells and reliability testing services for space and automotive applications.
The available solutions are:
1) Rad-Hard Latchup Detection and Protection (LDAP) with ≥ 100x more protection against Single-Event Latchup (SEL)
2) Rad-Hard Power Management Point-of-Load (PoL) with high power-efficiency over wide loads, smaller form factor and innate redundancy
3) Ultra-Low Soft-Error Rate (ULSE) Rad-Hard Digital Cell Library with 3.5x lower Power x Delay x IC Area and <10 FIT error-rate
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