LDO Voltage Regulator, 30 mA, Adjustable 0.45 V to 0.9 V Output
An Introduction to IC Test and Modus
Distinguished Engineer Rohit Kapur introduces the concept of scan testing and gives an overview of the Modus DFT Software Solution and Genus Synthesis Solutions from Cadence. Learn the basic steps of Design for Test (DFT) including scan design, test pattern generation (ATPG), and fault simulation.
Posted on Thursday Feb. 21, 2019

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