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Texas Instruments leads adoption of IEEE 1149.7 standard for improved JTAG functionalityNew two-pin test and debug standard enhances debug capabilities while alleviating package size and power concerns HOUSTON - Feb. 10, 2010 -- The ratification of the new IEEE 1149.7™ test and debug standard represents a major expansion and improvement of JTAG functionality. Texas Instruments Incorporated (TI) (NYSE: TXN) led the IEEE working group in the definition and adoption of the new two-pin IEEE 1149.7 standard, which improves debug capabilities and power constraints for system-on-chip (SoC) architectures. Additionally, with the standard's reduced number of pins and traces for smaller form factors, developers of mobile and handheld communications devices can leverage TI's OMAP™ 4 platform, which is the industry's first applications processor platform to incorporate this new standard. This allows developers to easily test and debug products with complex digital circuitry, multiple CPUs and applications software. For more information, please visit www.ti.com/ieee11497-prhome IEEE 1149.7 key features and benefits:
Find out more about the IEEE 1149.7 by visiting the links below:
About Texas Instruments Texas Instruments (NYSE: TXN) helps customers solve problems and develop new electronics that make the world smarter, healthier, safer, greener and more fun. A global semiconductor company, TI innovates through design, sales and manufacturing operations in more than 30 countries. For more information, go to www.ti.com.
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