LogicVision Signs Amos Technologies Ltd. as a Major Distributor in Israel

San Jose, Calif., April 29, 2002 - LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded test IP for integrated circuits and systems, today named AMOS Technologies Ltd. as the major distributor for LogicVision products in Israel. The contract allows AMOS Technology to sell LogicVision's Embedded Test 4.0 product line, which includes Logic BIST, IC Memory BIST, Chip Test Assemble, Embedded Logic Test, Core Test, PLL BIST, IC Debug, At-Speed Interconnect Test, External Memory Test and Programmable Memory BIST, throughout the region.

This engagement expands LogicVision's sales and customer service on a regional basis, allowing faster and broader deployment of LogicVision's Embedded Test Solutions. LogicVision's Embedded Test is a comprehensive IP test solution addressing chip design, chip manufacturing, system level testing, and ongoing test and diagnosis of final end-user products, qualities that match well with the region's high-end electronics focus.

"Israel has experienced continuous growth in the communications network, semiconductor and fabless industries. Major international companies such as Intel, Motorola, NSC, Analog Devices have established R&D and manufacturing centers in Israel. These companies are developing complex chips with greater than one million gates, including SoCs. To test these chips at speed is a major challenge," noted Boaz Amram, Amos Technologies Ltd.'s general manager. "Companies that use LogicVision's Embedded Test solution can immediately meet these test challenges and significantly benefit from the time-to-market, cost and quality advantages these proprietary technologies provide. We look forward to working with LogicVision and offering its Embedded Test Solutions to companies in Israel."

"We are pleased to enlist Amos Technologies as our major distributor in Israel," said Dale Olstinske, LogicVision's vice president of sales. "Amos' understanding of our target customers in Israel allows LogicVision to quickly increase its sales efforts and efficiently deploy its Embedded Test products in this region without the costs associated with establishing a LogicVision subsidiary in the region."

About Amos Technologies Ltd.

Amos Technologies, located in Ra'anana, Israel, specializes in representing leading companies in the fields of EDA and IC Design service companies. The company was founded by Boaz Amram, who has more than 16 years of experience in sales in Israel and in Europe, including working as the Director of Sales for LSI Logic in Israel and the General Manager of CATC Israel.

About LogicVision Inc.

LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision's embedded test solution allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip. For more information on the company and its products, please visit the LogicVision Web site at www.logicvision.com.

Contacts:
 

LogicVision, Inc. contact: Clarisse Balistreri  LogicVision, Inc.  (408) 453-0146  clarisse@logicvision.com	LogicVision agency contact: Vincent Mayeda  The Loomis Group  (909) 614-1767  vincent@loomisgroup.com
Amos Technologies contact: Boaz Amram  Amos Technologies  +972-9-7455872  boaz@amost.co.il

Forward-Looking Statements

Except for the historical information contained herein, the matters set forth in this press release, including statements as to the features and benefits of LogicVision's Embedded Test solution, including time-to-market, cost and quality advantages, and the expected benefits of the parties' relationship, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risks and uncertainties that could cause actual results to differ materially, including, but not limited to, the impact of technological advances and competitive products, general economic conditions affecting capital expenditures in the semiconductor industry and other risks detailed from time to time in LogicVision's SEC reports, including its Annual Report on Form 10-K for the year ended December 31, 2002. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.

LogicVision, Embedded Test, LogicVision Ready and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries. All other trademarks and service marks are the property of their respective owners.

Acronyms and Definitions

ATE: Automatic Test Equipment
ATPG: Automatic Test Pattern Generation
BIST: Built-in-Self-TestDFT: Design-for-Test
DFT: Design-for-Test
EDA: Electronic Design Automation
GDSII: An industry format describing the physical structure of the chip design and used to create mask tooling for chip manufacturing
GUI: Graphics User Interface
HDL: Hardware Description Language
IC: Integrated Circuit
RTL: Register Transfer-Level
Verilog: A hardware description language used to design and document electronic systems.
VHDL: VHSIC (Very High-Speed Integrated Circuit) HDL
IP: Intellectual Property
SoC: System-on-chip