Agere licenses BIST technology from LogicVision to reduce test costs

Agere licenses BIST technology from LogicVision to reduce test costs
By Semiconductor Business News
June 4, 2002 (5:52 p.m. EST)
URL: http://www.eetimes.com/story/OEG20020604S0052

SAN JOSE -- LogicVision Inc. today announced that Agere Systems Inc. has licensed its built-in-self-test (BIST) technology for use in its chip lines.

Under the agreement, Agere will use LogicVision's Embedded Test 4.0 for its hierarchical test design, debug and seamless integrated manufacturing test infrastructure. LogicVision's embedded test solution allows integrated circuit designers to embed test functionality into a semiconductor design.

As part of the multi-year agreement, Agere will deploy Embedded Test 4.0 to its design groups, delivering time-to-market value by reducing design-for-test implementation and verification time.

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