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0-In Design Automation to Present at Verisity's Worldwide Next-Generation Verification Seminar SeriesSeminars will teach engineers how to achieve verification closure in complex chip development projects SAN JOSE, Calif. - September 3, 2003 - Today 0-In Design Automation, the Assertion-Based Verification Company, announced that the company will be presenting at Verisity, Ltd.'s (Nasdaq:VRST) worldwide Autumn seminar series on verification methodology. The Next-Generation Verification Seminars will introduce Verification Process Automation (VPA) solutions and offer a step-by-step look at what it takes to achieve first-pass silicon success with today's extremely complex chips, systems, hardware and software systems and systems-on-chip. In addition, attendees will get a sneak peek at innovative new verification automation technologies that enable verification closure. The seminars are highly technical, focusing on VPA methodologies and techniques. Verisity will discuss concepts in driving verification closure by using verification metrics and process automation and show how these techniques scale from the module to the chip and the system level. 0-In will discuss structural coverage, a set of unified coverage metrics that link simulation with formal verification to provide users with actionable feedback about functional verification progress. These metrics support effective use of assertion-based verification, reduce total verification effort, and allow for earlier tape out with greater confidence. At the seminars, attendees will learn:
Seminar Schedule and Registration
Attendance at the seminars is free. Registration information and more details on the seminar contents are available at http://www.verisity.com/home/seminar2003/index.html or by sending an email to seminars@verisity.com or seminars@0-In.com. About 0-In # # #
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