A brief primer on embedded SoC packaging options
Deepak Behera, Sumit Varshney, Sunaina Srivastava, and Swapnil Tiwari, Freescale Semiconductor
11/20/2011 9:16 PM EST
With shrinking technology, voltage levels are being reduced, lowering noise margins required to enable a clean design from a signal integrity perspective. Higher operating frequency requirements further complicate design closure. Semiconductor packages are a quintessential piece of the signal integrity puzzle.
This article addresses the basics of packaging such as types of packages and their advantages and disadvantages, future trends, and factors to be considered while choosing a package.
E-mail This Article | Printer-Friendly Page |
Related Articles
- Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 2
- Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 1
- Testing Of Repairable Embedded Memories in SoC: Approach and Challenges
- An Efficient Device for Forward Collision Warning Using Low Cost Stereo Camera & Embedded SoC
- Overcoming advanced SoC routing congestion with 2.5D system in packaging
New Articles
- Accelerating RISC-V development with Tessent UltraSight-V
- Automotive Ethernet Security Using MACsec
- What is JESD204C? A quick glance at the standard
- Optimizing Power Efficiency in SOC with PVT Sensor-Assisted DVFS Technology
- Bandgap Reference (BGR) Circuit Design and Transient Analysis in 90nm VLSI Technology
Most Popular
- Accelerating RISC-V development with Tessent UltraSight-V
- System Verilog Assertions Simplified
- Synthesis Methodology & Netlist Qualification
- System Verilog Macro: A Powerful Feature for Design Verification Projects
- Enhancing VLSI Design Efficiency: Tackling Congestion and Shorts with Practical Approaches and PnR Tool (ICC2)