Basics of multi-cycle & false paths
Nitin Singh, Neha Agarwal,Arjun Pal Chowdhury (Freescale Semiconductor)
EDN (August 07, 2014)
One of the significant challenges to RTL designers is to identify complete timing exceptions upfront. This becomes an iterative process in complicated designs where additional timing exceptions are identified based upon critical path or failing path analysis from timing reports. This approach leaves a significant number of timing paths which may not be real, but these never get identified, since they may not come up in the critical path report. However, synthesis and timing tools will continue to expend resources optimizing these paths when it is not needed. At the same time, it can also impact area and power consumption of the device.
The intent of this document is to provide examples of false and multi cycle path exceptions that are easily missed by even experienced designers, and are identified through iterations on timing reports.
![]() |
E-mail This Article | ![]() |
![]() |
Printer-Friendly Page |
|
Related Articles
New Articles
- Why RISC-V is a viable option for safety-critical applications
- Dimensioning in 3D space: Object Volumetric Measurement by Leveraging Depth Camera-based Reconstruction on NVIDIA Edge devices
- What is JESD204B? Quick summary of the standard
- Post-Quantum Cryptography - Securing Semiconductors in a Post-Quantum World
- Analysis and Summary on Clock Generator Circuits and PLL Design
Most Popular
- System Verilog Assertions Simplified
- Enhancing VLSI Design Efficiency: Tackling Congestion and Shorts with Practical Approaches and PnR Tool (ICC2)
- System Verilog Macro: A Powerful Feature for Design Verification Projects
- Method for Booting ARM Based Multi-Core SoCs
- An Outline of the Semiconductor Chip Design Flow