English
Optimizing Automated Test Equipment for Quality and Complexity
By Jeorge Hurtarte, Teradyne (August 28, 2024)
AI is changing our world, driving unprecedented growth and innovation. High-performance chips at the heart of this revolution are marked by increasing complexity, precision requirements and integration of advanced technologies.
This explosive change is creating new demands on digital technology and the automated test systems on which semiconductor manufacturing relies. It is a comprehensive shift that demands flexible testing strategies to address new process architectures, heterogeneous packaging, and the complexities of hardware and software integration.
Today’s semiconductor test industry employs a multifaceted approach to tackle these diverse challenges. By advancing test equipment, integrating AI, adopting new standards, and optimizing test processes, the automated test equipment (ATE) industry is ensuring that it can keep pace with the rapid evolution of semiconductor technology and the needs of manufacturers.
|
E-mail This Article | 
|
|
Printer-Friendly Page |
Related Articles
- Automated Test-Bench for Mobile Applications
- Functional Qualification - An Automated and Objective Measure of Functional Verification Quality
- Shifting from functional to structured techniques improves test quality
- SoC Test and Verification -> SoC complexity demands new test strategies
- Optimizing Power Efficiency in SOC with PVT Sensor-Assisted DVFS Technology
New Articles
- Accelerating RISC-V development with Tessent UltraSight-V
- Automotive Ethernet Security Using MACsec
- What is JESD204C? A quick glance at the standard
- Optimizing Power Efficiency in SOC with PVT Sensor-Assisted DVFS Technology
- Bandgap Reference (BGR) Circuit Design and Transient Analysis in 90nm VLSI Technology
Most Popular
- Accelerating RISC-V development with Tessent UltraSight-V
- System Verilog Assertions Simplified
- Synthesis Methodology & Netlist Qualification
- System Verilog Macro: A Powerful Feature for Design Verification Projects
- Enhancing VLSI Design Efficiency: Tackling Congestion and Shorts with Practical Approaches and PnR Tool (ICC2)