The S5 Series offers 64-bit RISC-V performance with 32-bit power and area
EAVS - Electra IC Advanced Verification Suite for RISC-V Cores
A white paper written by Electra IC Team; Merve Eyüboğlu, Murat Tökez, Ibrahim Mouamar Ali Ahmed, Melike Atay Karabalkan, and Berna Ors.
Electra IC Advanced Verification Suite (EAVS) for RISC-V Cores is a powerful and flexible RISC-V core verification environment. It integrates a UVM testbench, Instruction Set Simulator (ISS), and automated validation tools to ensure compliance with RISC-V standards.
With randomized test generation, parametric flexibility, and seamless core integration, EAVS-DV enhances verification efficiency and accelerates development. Designed for adaptability, it supports various RISC-V implementations, providing a scalable and reusable solution for next-generation processor validation.
To read the paper, click here.
|
ElectraIC Hot IP
Related Articles
- Extraction Challenges Grow in Advanced Nanometer IC Design
- Consumer IC Advances -> Meeting MPEG-4 advanced audio coding requirements
- Advanced Packaging and Chiplets Can Be for Everyone
- Optimal OTP for Advanced Node and Emerging Applications
- Advanced Topics in FinFET Back-End Layout, Analog Techniques, and Design Tools
New Articles
- EAVS - Electra IC Advanced Verification Suite for RISC-V Cores
- Why RISC-V is a viable option for safety-critical applications
- Dimensioning in 3D space: Object Volumetric Measurement by Leveraging Depth Camera-based Reconstruction on NVIDIA Edge devices
- What is JESD204B? Quick summary of the standard
- Post-Quantum Cryptography - Securing Semiconductors in a Post-Quantum World
Most Popular
- System Verilog Assertions Simplified
- Enhancing VLSI Design Efficiency: Tackling Congestion and Shorts with Practical Approaches and PnR Tool (ICC2)
- An Outline of the Semiconductor Chip Design Flow
- Design Rule Checks (DRC) - A Practical View for 28nm Technology
- Synthesis Methodology & Netlist Qualification
![]() |
E-mail This Article | ![]() |
![]() |
Printer-Friendly Page |