D&R Industry Articles (March 2020)

Featured Article

NeoPUF, A Reliable and Non-traceable Quantum Tunneling PUF

PUF stands for “Physically Unclonable Function” and is a physically derived “fingerprint” that serves as a unique identity for semiconductor devices. Their properties depend on the uniqueness and randomness of the physical factors induced during the manufacturing stage of a chip. T

Featured Article

Understanding Physical Unclonable Function (PUF)

A growing number of ASICs, microcontrollers and SoCs embed hardware cryptographic accelerators or software cryptographic libraries. The emergence of the Internet of Things (IoT) will call for an even faster adoption. We now can talk about cryptography pervasion.

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Shift Power Reduction Methods and Effectiveness for Testability in ASIC

The purpose of this article is to highlight the different methodologies to reduce power consumption during ASIC manufacture testing. It distinguishes the different architectures & methodologies to optimize power consumption during a test mode of the design with implementation. There are number of techniques to reduce power consumption with different EDA tools available in the industry.

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Improving performance and security in IoT wearables

Many IoT applications – including connected cars, factory automation, smart city, connected health, and wearables – require nonvolatile memory to store data and code. Traditionally, embedded applications have used external Flash memory for this purpose.

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Testing Embedded MRAM IP for SoCs

With momentum building for Spin Transfer Torque MRAM (STT-MRAM) as the leading flavor of embedded MRAM technology, this white paper focuses on unique test challenges for STT-MRAM on-chip memory while considering needs for automotive applications.